Measurement Error: Models, Methods, and Applications
ISBN: 9780429150357
Platform/Publisher: Taylor & Francis / Chapman and Hall/CRC
Digital rights: Users: Unlimited; Printing: Unlimited; Download: Unlimited



Over the last 20 years, comprehensive strategies for treating measurement error in complex models and accounting for the use of extra data to estimate measurement error parameters have emerged. Focusing on both established and novel approaches, Measurement Error: Models, Methods, and Applications provides an overview of the main techniques and illu

John P. Buonaccorsi is a professor in the Department of Mathematics and Statistics at the University of Massachusetts, Amherst.

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